ГАЛУЩАК, М. О.; ДЗУНДЗА, Б. С.; ТКАЧУК, А. І.; ФРЕЇК, Д. М. AUTOMATED COMPLEX FOR MEASUREMENT OF THERMOELECTRIC PARAMETERS OF SEMICONDUCTORS. METHODS AND DEVICES OF QUALITY CONTROL, [S. l.], n. 1(30), p. 79–83, 2013. Disponível em: https://mpky.nung.edu.ua/index.php/mpky/article/view/161. Acesso em: 21 nov. 2024.