ГАЛУЩАК, М. О.; ФРЕЇК, Д. М.; КАРПАШ, М. О.; ТКАЧУК, А. І. Measuring method of thermo-electric quality of semiconductor materials. METHODS AND DEVICES OF QUALITY CONTROL, [S. l.], n. 1(26), p. 97–99, 2011. Disponível em: https://mpky.nung.edu.ua/index.php/mpky/article/view/263. Acesso em: 22 nov. 2024.