Галущак, М. О., Д. М. Фреїк, М. О. Карпаш, and А. І. Ткачук. “Measuring Method of Thermo-Electric Quality of Semiconductor Materials”. METHODS AND DEVICES OF QUALITY CONTROL, no. 1(26) (March 24, 2011): 97–99. Accessed April 3, 2025. https://mpky.nung.edu.ua/index.php/mpky/article/view/263.